Abstract
Bi-2223 tapes are usually subjected to tensile strain, bending strain and compressive stress in the process of fabrication and applications. In this study, we have measured the critical current of Bi-2223 tapes as a function of transverse compressive stress. The effects of the cross section size and processing defects on the stress characteristics of AgMn-alloy sheathed Bi-2223 tapes are compared. The experimental results showed that the onset transverse compressive stress for degradation of Ic was lower in the thinner tape with a thin Ag sheath due to the stress concentration on the irregular interface. The bubbled tapes were more sensitive to the transverse stress compared to the nonbubbled tapes.
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