Abstract
The effect of implanted yttrium on the growth mechanism of alumina scales on β-NiAl intermetallic was studied as a function of temperature (1273–1473 K) using a two-stage oxidation method with 18O oxygen isotope as a tracer. The distribution of the tracer across the scale was determined by secondary ion mass spectrometry (SIMS) and the scale morphology by scanning electron microscopy (SEM). It has been shown that the presence of yttrium in the surface layer of the substrate strongly influences the transport processes in the growing scale by suppressing the inward diffusion of oxygen.
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