Abstract
AbstractWe have extended the one‐dimensional transmission‐line modelling (TLM) of diffusion, drift and recombination of charge carriers in semiconductors to multiple dimensions. Detailed TLM formulation of the continuity transport equation in a more general form is presented.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: International Journal of Numerical Modelling: Electronic Networks, Devices and Fields
Paper Title
Journal
Date
