Transmission of low energy (< 10 eV) oxygen ions through ultrathin xenon films

Abstract

In studies of desorption induced by electronic transitions (DIET) such as electron or photon stimulated desorption, it is important to know whether the desorbing species originate solely from the outermost surface layer, or also from layers beneath the surface. In order to gain better understanding of the charge transfer, elastic scattering, and other inelastic processes involved in this issue, we are currently performing a series of experimental studies of the transmission of low energy ions (∼ 7 eV) through ultrathin films (submonolayer to multilayer) of condensed gases. Here we report on the first quantitative measurements of the yield, angle, and energy of oxygen ions after transmission through ultrathin films of xenon. In our novel approach, a focused 300 eV electron beam bombards a target at 25 K consisting of an oxidized tungsten (100) crystal with adsorbed overlayers of xenon. In the absence of the xenon, O + ions desorb in a sharp beam normal to the surface, as measured in a velocity and angle resolving ESDIAD apparatus (electron stimulated desorption ion angular distribution). When Xe layers are present, some oxygen ions penetrate several monolayers of xenon without significant change in energy and angle while others seem to be scattered by large-angle elastic scattering or to be attenuated from the O + beam. The work presented is the first experimental study of the depth of origin of desorbing ions in DIET processes.