Abstract
Transmission electron microscopy (TEM) images of disclination defects are modeled in the framework of Howie–Whelan two-beam approach and by taking into account elastic distortions associated with the defects. Disclinations are generated in crystalline materials in the course of plastic deformation and can be observed in the junctions of several grain or cell boundaries. The lines of disclinations are assumed to be parallel or perpendicular to the free surfaces of a thin foil. For such a geometry disclination elastic fields (e.g. displacements and stresses) in the foil interior are constructed by applying the technique of ”virtual“ surface defects. The obtained results demonstrate the possibility to extract the disclination parameters from the data of TEM observations.
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