Abstract
A practical procedure to distinguish b- and c-axes of β-FeSi2 by a conventional transmission electron diffraction (TED) method has been demonstrated using β-FeSi2 formed on a Si substrate. The TED patterns for β-FeSi2 with the incidence of [010] and [001] are almost the same as in the zeroth-order Laue zone. However, they can be distinguished from each other by the arrangement of diffraction spots in the first-order Laue zone.
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