Abstract
A description of the interference immunity testing of electrical products is given, and the need for traceable calibration methods of the associated testing generators is described. A presentation of three analysis techniques to verify the respective testing modes of immunity testing generators is given, together with typical uncertainties. A deconvolution method developed for the phase characterization of the analog-to-digital converter (ADC) used in this work is reported. A least squares algorithm for the piecewise analysis of the International Electrotechnical Committee (IEC) flat-top waveform is presented in the Appendix.
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