Abstract
Thin film specimens on scotch tape base with analyte amounts in ng level have been used for trace element determinations in Certified Reference Materials (CRMs) of uranium oxides. The samples were prepared by dissolving the CRMs in nitric acid and separating the major matrix uranium by solvent extraction. Small volume aliquots of the aqueous phases, obtained after uranium matrix separation from sample solutions, were mixed with gallium internal standard and deposited on scotch tape supports. These specimens were presented for Energy Dispersive X-Ray Fluorescence measurements. The trace elements present in the specimens were determined after processing the spectra and consideration of the relative sensitivity values of the elemental X-ray lines. The results obtained were found to be in good agreement with the Total reflection X-Ray Fluorescence (TXRF) determined and certified values. The methodology has all the advantageous features of TXRF for nuclear material elemental characterization e.g. small sample amount requirement, multi-elemental analytical capability etc. along with simple instrumentation. In addition, such specimens can be isolated using scotch tape sealing and spread of radioactive materials during their analysis can be avoided.
Published Version
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