Trace element analysis and element mapping by scanning X-ray fluorescence at daresbury SRS

Abstract

Synchrotron radiation can be used as an exciting source for X-ray fluorescence trace element analysis. At the Daresbury SRS trace element analysis equipment is under construction. A broad-band graphite mosaic monochromator is used to select the excitation energy. A sample changer will be installed in a vacuum chamber. First trials have been made with a doubly curved silicon crystal to focus the synchrotron radiation beam. An X-ray microprobe apparatus for scanning trace element mapping is under development.