Abstract
Abstract The survey analysis capabilities of spark source mass spectrography have proved to be very important in the determination of very low concentrations of elements in nonconductors and semiconductors. Some of the methods devised for the special handling and sparking of the poor conductors have been reviewed by Guthrie1. In general, attempts to initiate and sustain a radio frequency spark between nonconductor self-electrodes require inconviently high spark voltages and considerable operator time and attention. Moreover, the low ion yields often characteristic of the nonconductor self-electrode spark compel exposure times commonly in excess of one hour for exposure levels requisite for the detection of impurities at 1 part-per-million concentrations.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
