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https://doi.org/10.1049/el:20020487
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Cite Journal: Electronics Letters |  Publication Date: Jul 4, 2002 |
 Citations: 4 |
A novel match technique is proposed to overcome the dilemma of achieving electric match and maximum magnetic sensitivity in the cross-coupled CMOS magnetic field-effect transistor pair. A relative increment of 18.8% in the absolute sensitivity has been achieved under the new match technique for a commercial 1.5 µm CMOS process.
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