Abstract
We report a total x-ray scattering (TXS) system for structural analysis of crystalline particle materials at the BL15XU NIMS beamline of SPring-8 in Japan. To achieve a high angular resolution over a high Q region up to 25 Å-1, the TXS system was capable of measuring to 120° at an x-ray energy of 29.02keV with five CdTe pin detectors. The sample alignment and measuring system were controlled by LabView software. The x-ray pair distribution function (PDF) results for Ni bulk powder and Pt and AgRh nanoparticles were successfully simulated by the PDFgui program. In addition, Rietveld refinement results were also obtained from x-ray diffraction patterns, reflecting long-range order in the Pt nanoparticles. We expect that this TXS system may be useful for understanding structural information of crystalline nanoparticles, including amorphous features at their surface region.
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