Abstract
We introduce a high-performance differential dilatometer based on an all-fiber Michelson interferometer at cryogenic temperature with 10-10 resolution in δL/L. It resolves the linear thermal expansion coefficient by measuring the oscillating changes of sample thickness and sample temperature with the interferometer and in situ thermometer, respectively. By measuring the linear thermal expansion coefficient α near the antiferromagnetic transition region of BaFe2As2 as a demonstration, we show that our dilatometer is able to measure thin samples with sub-pm-level length change resolution and mK-level temperature resolution. Despite the residual background thermal expansion of a few nm/K in the measurement results, our new dilatometer is still a powerful tool for the study of phase transition in condensed matter physics, especially has significant advantages in fragile materials with sub-100 μm thickness and being integrated with multiple synchronous measurements and tuning thanks to its extremely high resolution and contactless nature. The prototype design of this setup can be further improved in many aspects for specific applications.
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