Abstract
Total reflection high-energy positron diffraction (TRHEPD) promises to be an ideal technique for determining the atomic arrangement of solid surfaces. TRHEPD makes full use of the total reflection of the positron beam from a surface in reflection high-energy positron diffraction (RHEPD), the positron counterpart of reflection high-energy electron diffraction (RHEED). Owing to the development and use of a brightness-enhanced intense positron beam at KEK, it is now possible to obtain clear TRHEPD patterns. It is shown that the TRHEPD pattern from a Si(111)-7×7 reconstructed surface for the total reflection condition does not contain contributions from atoms in the bulk.
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