Abstract
It is shown that the reflection high-energy positron diffraction (RHEPD) pattern from a Si(111)-(7 × 7) reconstructed surface for the total reflection condition, that is, the total reflection high-energy positron diffraction (TRHEPD) pattern, does not contain contributions from atoms in the bulk. Now, a method of observing the diffraction pattern formed only by the atoms on the topmost surface by a straightforward measurement of a bulk sample is available.
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