Abstract
Total Ionizing Dose Effects in Advanced 28 nm Charge Trapping 3D NAND Flash Memory
Published Version
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https://doi.org/10.3390/electronics14030473
Copy DOIJournal: Electronics | Publication Date: Jan 24, 2025 |
Total Ionizing Dose Effects in Advanced 28 nm Charge Trapping 3D NAND Flash Memory
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