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https://doi.org/10.1016/0026-2714(86)90295-7
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Cite Journal: Microelectronics Reliability |  Publication Date: Jan 1, 1986 |
 Citations: 5 |
Affiliation: Delft University of Technology
An algorithm for calculating the top-event's failure frequency of multi-state fault trees is introduced, which is appropriate for a module by module analysis of complex systems.
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