Abstract
The Glass-ceramics 10GeO2-(55-x) SiO2 - 29PbO-5Al2O3-1TeO2 doped with varying amounts of TiO2 (0 ˂ x ˂ 5 mol %) were prepared through the process of melt quenching followed by heat treatment. X-ray Diffraction (XRD), Scanning Electron Microscopy (SEM) and Differential Thermal Analysis (DTA) were used to analyze these glass ceramics besides the usual spectral studies like optical absorption, Electron Paramagnetic Resonance (EPR), Fourier Transform Infrared Spectroscopy (FTIR) and Raman. These investigations demonstrated the existence of crystalline phases that comprise complexes of Ti4+ as well as Ti3+ ions that were dispersed randomly. Additionally, it is seen that Ti3+ ions, which are more prevalent as TiO2 concentration rises, take up the tetragonally deformed octahedral positions inside the network of glass ceramics. FTIR spectra of the synthesized samples provided information regarding the existence of different structural units in the glass ceramic matrix, which included SiO4, GeO4, GeO6, PbO4, PbO6, AlO6, TeO4, TeO3, TiO4, and TiO6. At 30 °C, the 3 mol % Ti-doped sample has a minimum conductivity of 1.623 x 10-9 S.cm-1. Therefore, the dielectric and spectroscopic investigations suggest that glass ceramics containing 3 mol% of TiO2 are rigid and appropriate for dielectric applications.
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