Abstract
The main goal of this research, as discussed in Chapter 2, is to develop effective decomposition procedures to minimize Lmax in complex job shops of the type encountered in semiconductor testing and wafer fabrication facilities. In the workcenter-based approach we have followed, a key subproblem is that of minimizing Lmax on a workcenter consisting of a single machine, or parallel identical machines, in the presence of sequence-dependent setup times. These problems are strongly NP-hard, and are thus of considerable interest in their own right, apart from their importance in developing effective decomposition procedures for the overall job shop problem. Experiments with generic decomposition procedures in Chapters 5 and 6 have shown that the quality of the subproblem solutions has a significant effect on the quality of the solution obtained for the overall problem. Hence it is desirable to develop heuristics that generate higher-quality solutions in reasonable computation times.
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