Abstract
The use of a conventional X-ray diffractometry together with curved position sensitive detector (PSD) allows for a complete diffraction pattern to be recorded as a function of time and temperature, so that transformations in the solid state can be traced sequentially. In this way, this technique can be regarded as complementary to the conventional thermal analysis methods, as thermogravimetry and differential scanning calorimetry. Three applications are described: the thermal decomposition of a cadmium hydroxide nitrate, the phase transformation of the dicesium cadmium tetraiodide and the investigation of microsturctural properties as a function of temperature.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
