Time-resolved X-ray diffraction system for study of Pb(Zr, Ti)O3 films under a temporal electric field at BL15XU, SPring-8.

Abstract

We report on the use of a time-resolved X-ray diffraction system to study a piezoelectric material under a temporal electric field at the BL15XU NIMS beamline, at SPring-8 in Japan. By synchronizing focused X-rays onto a device under an applied electric field with a two-dimensional detector and measurements performed with respect to the synchrotron clock signal, we successfully observed shifts of the 222 Bragg peak of 750-nm-thick Pb(Zr, Ti)O3 films near time zero under a unipolar rectangular wave at 24 V. We expect that this system might be useful for understanding the piezoresponse, lattice dynamics, and domain switching dynamics of functional oxide thin films.