Abstract
The momentary crystal structure of a Y-cut langasite oscillator resonantly vibrating under an alternating electric field is revealed by time-resolved crystal structure analysis to understand the microscopic mechanism of piezoelectricity. The thickness-shear lattice strain under an electric field is amplified ∼103 times by the resonant effect. The lattice vibration involves the deformation of GaO4 and Ga0.5Si0.5O4 tetrahedra accompanied by atomic displacements of specific oxygen atoms along the electric field. The deformation of GaO4 and Ga0.5Si0.5O4 tetrahedra enhances the piezoelectricity of langasite.
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