Time Projection Compton Spectrometer (TPCS)

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We propose a new technique for measuring the time-integrated energy spectrum of X rays emitted by high-intensity, medium-voltage flash x-ray sources. The method sorts Compton electrons by drift velocity time-of-flight in a non-uniform magnetic field. We explain a conceptual spectrometer design, show how we have modeled it using Monte Carlo methods, and discuss how one would unfold x-ray spectrum information from electron time-of-flight data. The technique appears promising, especially for short-pulse x-ray sources.