Abstract
The measurement and characterization of RF and microwave components and systems has been dominated by a tone-based frequency-domain paradigm because of its simplicity and accuracy. This review article describes new and accurate time-domain techniques that are superior for application to wideband and nonlinear contexts. © 2003 Wiley Periodicals, Inc. Int J RF and Microwave CAE 13: 5–31, 2003.
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