Abstract
Understanding of magnetization behavior in magnetic nanostructures is a key issue for future magnetic/spintronic devices. Time-resolved X-ray magnetic circular dichroism (XMCD) is a powerful measurement technique with potential of nanometer spatial resolution, picosecond time resolution, and element selectivity. We have carried out time and spatially resolved XMCD microscopy measurement on a Co/Pt multilayer dot by detecting XMCD at the Pt $L_{3}$ edge at BL39XU of SPring-8 using hard X-ray. Transient magnetic response of Co/Pt multilayer dots with diameter of $2.6~\mu \text{m}$ was investigated against pulsed RF field with frequency around 2.5 GHz and the maximum amplitude of about 400 Oe. By synchronizing excitation RF field pulse with X-ray pulses, the growth of magnetization precession of the induced Pt magnetic moment in the dot was clearly observed with sub-100 ps time resolution and submicrometer spatial resolution. The developed measurement setup can be applicable for a wide range of studies for time-resolved hard X-ray experiments.
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