Abstract
TI-based films were prepared by the 2-step procedure. First, Ba-Ca-Cu-O precursors were deposited either from an aerosol or by thermal evaporation on MgO substrates. Thallination of precursors was then performed at 850 °C in flowing oxygen with annealing time up to 30 min. Films were characterized by Tc and X-ray measurements, and their depth profiles (RBS), surface morphology (SEM) and oxygen Raman modes were also investigated. The aerosol deposited films gave Tc = 94−103.5 K. Films grown by thermal evaporation revealed unusual Tc and structural changes during their 20-months storage in laboratory surroundings. Their Tc has increased from 94 to 106 K.
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