Abstract
The threshold ionization energy of C 60 vacuum-deposited thin films was determined to be 6.17 ± 0.07 eV by ultraviolet photoemission spectroscopy with low photon-energy excitations and retarding-field analysis of photoemitted electrons. This method also enabled to determine the work function to be 4.85 ± 0.05 eV. The obtained values can be compared with the values reported so far and are discussed in terms of energetic relaxation of a C 60 molecule via condensation to the solid state.
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