Abstract

We derive a generalized expression for the threshold current of the Kirk effect (base widening) in bipolar transistors that have a fully depleted collector and a nonuniform dopant distribution in the collector. This generalized expression can be helpful to the analysis of the electrical characteristics, such as the cutoff frequency as a function of bias conditions, and hence to the optimization of such devices

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.