Abstract

SummaryCombined focused ion beam and scanning electron microscope (FIB‐SEM) tomography is a well‐established technique for high resolution imaging and reconstruction of the microstructure of a wide range of materials. Segmentation of FIB‐SEM data is complicated due to a number of factors; the most prominent is that for porous materials, the scanning electron microscope image slices contain information not only from the planar cross‐section of the material but also from underlying, exposed subsurface pores. In this work, we develop a segmentation method for FIB‐SEM data from ethyl cellulose porous films made from ethyl cellulose and hydroxypropyl cellulose (EC/HPC) polymer blends. These materials are used for coating pharmaceutical oral dosage forms (tablets or pellets) to control drug release. We study three samples of ethyl cellulose and hydroxypropyl cellulose with different volume fractions where the hydroxypropyl cellulose phase has been leached out, resulting in a porous material. The data are segmented using scale‐space features and a random forest classifier. We demonstrate good agreement with manual segmentations. The method enables quantitative characterization and subsequent optimization of material structure for controlled release applications. Although the methodology is demonstrated on porous polymer films, it is applicable to other soft porous materials imaged by FIB‐SEM. We make the data and software used publicly available to facilitate further development of FIB‐SEM segmentation methods.Lay DescriptionFor imaging of very fine structures in materials, the resolution limits of, e.g. X‐ray computed tomography quickly become a bottleneck. Scanning electron microscopy (SEM) provides a way out, but it is essentially a two‐dimensional imaging technique. One manner in which to extend it to three dimensions is to use a focused ion beam (FIB) combined with a scanning electron microscopy and acquire tomography data. In FIB‐SEM tomography, ions are used to perform serial sectioning and the electron beam is used to image the cross section surface. This is a well‐established method for a wide range of materials. However, image analysis of FIB‐SEM data is complicated for a variety of reasons, in particular for porous media. In this work, we analyse FIB‐SEM data from ethyl cellulose porous films made from ethyl cellulose and hydroxypropyl cellulose (EC/HPC) polymer blends. These films are used as coatings for controlled drug release. The aim is to perform image segmentation, i.e. to identify which parts of the image data constitute the pores and the solid, respectively. Manual segmentation, i.e. when a trained operator manually identifies areas constituting pores and solid, is too time‐consuming to do in full for our very large data sets. However, by performing manual segmentation on a set of small, random regions of the data, we can train a machine learning algorithm to perform automatic segmentation on the entire data sets. The method yields good agreement with the manual segmentations and yields porosities of the entire data sets in very good agreement with expected values. The method facilitates understanding and quantitative characterization of the geometrical structure of the materials, and ultimately understanding of how to tailor the drug release.

Highlights

  • For 3D imaging of porous microstructures, combined focused ion beam and scanning electron microscope (FIB-scanning electron microscopy (SEM))FIB-SEM tomography is used on a routine basis for highly conductive materials and ceramics, but for soft, poorly conducting and porous materials, the technique is less straightforward

  • We develop a segmentation method for FIB-SEM data from ethyl cellulose porous films made from ethyl cellulose and hydroxypropyl cellulose (EC/HPC) polymer blends

  • We have developed a segmentation method for FIB-SEM data samples of EC porous films produced from EC/HPC polymer blends where the HPC phase has been leached out to obtain

Read more

Summary

Introduction

For 3D imaging of porous microstructures, combined focused ion beam and scanning electron microscope (FIB-SEM)FIB-SEM tomography is used on a routine basis for highly conductive materials and ceramics, but for soft, poorly conducting and porous materials, the technique is less straightforward. Charges due to the electron beam exposure can accumulate, observed as very bright regions in the images. Curtaining effects, i.e. lines parallel to the ion beam can be caused by local variations in hardness or thickness within the sample, resulting in varying ion milling rates locally and in effect a nonplanar cross-section. This artefact can be reduced by lowering the milling rate or depositing a platinum coating on the sample surface (Giannuzzi & Stevie, 2005).

Methods
Results
Conclusion
Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call