FIB/SEM and Automated Mineralogy for Core and Cuttings Analysis

Abstract

Abstract New high resolution microscopy solutions are being used for conventional and unconventional reservoir characterization at both micron and nanometer scales. Focused Ion Beam and Scanning Electron Microscope (FIB/SEM) technology combines the high resolution of a SEM with the precise milling capability of a FIB. 3D reconstructions with resolution of a few nanometers are made possible, leading to new insights into rock fabrics, porosity and permeability. Illustrative FIB/SEM data of shale and carbonate reservoirs are presented. High resolution imaging resolves the complex micro-structure and microporosity present in the shale and carbonate. Automated Mineralogy, another emerging solution for petrological analysis, involves the ultrafast mineral and textural mapping of cuttings and cores, achieved through a fully integrated system comprising automated SEM imaging and energy dispersive X-ray spectroscopy (EDS). Through customized analysis software, the resulting false-colored images can be used to quantify the mineralogy, grain size, grain density, porosity, and lithotypes, on a cutting-by-cutting or core-by-core sample basis. These data in turn can be used to provide objective inputs into geological, geophysical, and engineering interpretations of reservoir properties.