Abstract
We present a three-dimensional (3-D) optical coherence tomography (OCT) system based on a dual axis microelectromechanical system (MEMS) mirror. The MEMS mirror provides high-speed, high resolution 2-axis scanning while occupying a very small volume with extremely low power consumption. The dimensions of the mirror are 600/spl times/600 /spl mu/m, and both axes are capable of scanning up to 30 degree angles at frequencies greater than 3 kHz with good linearity. A 3-D image set is acquired when the MEMS mirror is integrated with the fiber-based OCT system. Via 2-axis lateral scanning, combined with an axial scan, a volume (2/spl times/2/spl times/1.4 mm) image of tissue, including a cancerous region, from a hamster cheek pouch was obtained. Using a signal processing technique, image data is normally presented by 3-volume showing views at arbitrary angles and locations. The objective of this work is to show the capabilities of a 3-D OCT system utilizing a MEMS scanner as this technology can readily by applied to realize OCT beam delivery systems such as hand held scanners and endoscopic probes. A MEMS based 3-D OCT system employing a high speed, small volume scanner may have the potential to expand the application area of OCT and revolutionize areas of clinical medicine as well as medical research.
Highlights
O PTICAL coherence tomography (OCT) is a well known technique capable of performing cross sectional imaging
We report the use of MEMS technology for 3-D OCT imaging
We have presented a 3-D OCT imaging system employing a 2-axis MEMS scanner
Summary
O PTICAL coherence tomography (OCT) is a well known technique capable of performing cross sectional imaging. OCT became an attractive technology in medical imaging because of several advantages, such as high spatial resolution, noninvasiveness, and real time measurement [1]–[4]. OCT research has focused on many applications in the fields of biology and biomedicine. Wilder-Smith are with the Beckman Laser Institute, University of California, Irvine CA 92717 USA
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More From: IEEE Journal of Selected Topics in Quantum Electronics
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