Abstract
A perovskite solar cell (PSC) is one of the leaders in the field of photovoltaic technology. In spite of stunning progress, full understanding of the operation mechanism of a PSC is still necessary to further improve device performance. In this study, due to surface roughness, interfaces between the active layers with electron and hole transfer layers were added to the study model as new d <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">1</sub> and d <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> layers, respectively. The new layers were introduced as a structure, whose dielectric function is a random combination of adjacent layers. This way, by the finite-difference time-domain method, parasitic absorptions of d <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">1</sub> and d <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> layers were calculated and compared with the partial absorption of the active layer. The results of this study show that the parasitic absorption due to surface roughness between TiO <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> and CH <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> NH <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> PbI <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> (d <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">1</sub> layer) greatly affects the partial absorption of the active layer of the cell. The parasitic absorption in this region occurs especially at the UV wavelength and near it and increases with increasing roughness in other parts of the spectrum. In contrast, the layer formed due to surface roughness between CH <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> NH <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> PbI <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> and Spiro-OMeTAD (d <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> layer) is not very effective in terms of optics. The optical results of this model, along with predetermined electrical assumptions, lead to the proper description of cell behavior. This can be considered as the correctness of the simulation procedure. Therefore, this method can explain how the presence of such a d <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">1</sub> layer, which is formed in the manufacturing process and is inevitable, can lead to better cell performance.
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