Abstract
The secondary electron emission mode of the scanning electron microscope, used for the observation of surface topography, can be implemented by selective etching of specimens. Further enhancement of the three-dimensional nature of scanning electron micrographs may be obtained by employing stereomicroscopy techniques. The three-dimensional aspect of micrographs at high magnification is especially useful in studying micro-structural details of a broad range of materials. Secondary electron emission variation, caused by compositional differences, can provide additional information. Examples of the study of phase separation in glass, pore morphology in porous glass, surface character as well as size and shape of glass spheres and ground glass particles, and nucleation and crystal growth at interfaces and in glass-crystal systems are illustrated.
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