Abstract
Epitaxial multilayers of Ba 0.8 Sr 0.2 TiO 3 and Ba 0.4 Sr 0.6 TiO 3 were grown by pulsed laser deposition on MgO substrates using an La 0.5 Sr 0.5 CoO 3 bottom electrode. Some of the samples had a thin Ba 0.6 Sr 0.4 TiO 3 buffer layer grown onto the bottom electrode to control the strains in the multilayers. The epitaxial relations, crystal perfection, and strains in the multilayers were studied by x-ray diffraction at room temperature. The dielectric properties were studied as a function of temperature. Correlation between lattice parameters, strain distributions, and width of the dielectric peaks is analyzed.
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