Abstract
Thickness-dependent structural, magnetic and transport properties of La0.5Sr0.5MnO3 (LSMO) thin films have been studied. A series of the LSMO films with thickness 30, 60, 125 and 300 nm have been deposited on the LaAlO3 substrate using DC magnetron sputtering. The paramagnetic to ferromagnetic transition at T C is followed by antiferromagnetic ordering at T N in all films. It is also found that all LSMO films have T C lower than that of bulk LSMO. A small variation of T C is observed on increasing the film thickness. However, T N is found to rise with increase in the film thickness. The 60 nm-thick film shows a wide insulator to metal transition. The resistivity above 240 K of the films with various thicknesses is consistent with a small polaronic hopping conductivity. The polaronic formation energy E A rises with the increase of the film thickness except for 60 nm thin film, where a small decline in E A is observed. The correlation between observed structural, magnetic and electrical properties with the thickness of the films has been discussed in this paper.
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