Abstract
The effects of film thicknesses on the electronic transport and percolative metal-insulator (M-I) transition of La1−xSrxMnO3 (LSMO) films have been investigated. The conductivity increases with the layer thickness; this is regarded as the relaxation of tensile strains and reduction in grain boundaries (fewer scattering centers) as well as shorter hopping distances, which suppresses the Jahn–Teller distortion or enhances the double exchange. It is also observed by conductive atomic force microscopy (CAFM) that metallic and insulating regions coexist in LSMO films. The domains undergo a percolative M-I transition, and TM-I observed by CAFM is consistent with the result of four-point probe measurements.
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