Abstract
In the characterization of buried interfaces with sum frequency generation spectroscopy (SFG), the bulk thickness-dependent IR distortion effects on delay-dependent SFG spectra were identified: Around time zero, the SFG signal intensity reduced with the film thickness increasing while the overall spectral shape sustained; at positive time delays, bulk refraction ruled, and the distorted SFG spectral shape showed similar features as resonant SFG bands of surface molecular species. Both linear and nonlinear refraction effects were observed based on the delay-dependent and film thickness-dependent results. These results provide useful implications for spectral interpretation for in situ SFG spectroscopy of buried interfaces.
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