Abstract
Thick target excitation yield curves of gamma-rays from the reactions 27Al(p,p′γ)27Al (Eγ=844 and 1014keV), 27Al(p,αγ)27Al (Eγ=1369keV), 28Si(p,p′γ)28Si (Eγ=1779keV), 29Si(p,p′γ)29Si (Eγ=1273keV) and 31P(p,p′γ)31P (Eγ=1266keV) were measured by bombarding pure-element targets with protons at energies below 3MeV. Gamma-rays were detected with a High Purity Ge detector placed at an angle of 90° with respect to the beam direction. The obtained thick target gamma-ray yields were compared with the previously published data. The overall systematic uncertainty of the thick target yield values was estimated to be better than ±9%.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
