Abstract
Thermomechanical fatigue in lab-type Sn–Ag–Cu solder interconnections between two copper plates has been investigated under cyclic thermal loading within a number of temperature ranges. Fatigue mechanisms have been studied using optical and scanning electron microscopy. Among the various fatigue mechanisms observed the occurrence of persistent slip bands is notable. From the correlation of the microscopic observations and stress fields calculated using elastic finite element modelling, it appears that three crucial factors govern the evolution of fatigue damage: thermal mismatch between Cu and solder, intrinsic thermal mismatches caused by Sn anisotropy and the mechanical constraints posed by the Cu on the soldered joint. The stress fields resulting from these combined sources determine the location and severeness of fatigue damage in solder joints. The relative predominance of these factors is discussed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
