Abstract
Tellurium thin films of thicknesses between 25 and 200 nm have been vacuum-deposited on glass substrates at room temperature in a vacuum of 5×10−5torr. The thermoelectric power measurements on these films have been carried out, after annealing, in the temperature range from 300 to about 500 K. It is found from the study that thermoelectric power is independent of temperature and is also, apparently, independent of thickness, over the range of temperatures and thicknesses investigated. The results are discussed on the basis of size effect and thermoelectric effect theories.
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