Abstract
Thermally stimulated luminescence (TSL) properties of cerium and terbium doped SiO 2 sol–gel glasses were studied after X-ray irradiation in the temperature range 10–700 K. The role of Ce 3+ and Tb 3+ as recombination centers was shown. The existence of a distribution of trap levels was observed; the activation energies of such a distribution were calculated to extend from about 8 × 10 −3 eV up to 1.8 eV for both cerium and terbium doped sol–gel glasses. The effect of a post-densification thermal treatment on TSL properties was also analyzed.
Published Version
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