Abstract
It is demonstrated that a wealth of unambiguous information on the details of the atomiclattice dynamics of solidsolution films can be acquired from a spectral study of the resonance features of thermal fields in immediate proximity to the planarstructure surface. The calculated spectral densities of the pand spolarized states of the nonradiative componen t of thermal fields in a planelayered (or Cd xZn 1- xTe solid solution filmonmetal substrate) system are compared us ing the refraction additivity principle. The spectral densities are calculated for different impurity concentrations and thicknesses of the film and various distances from the structure surface.
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