Abstract
This paper presents an electrothermal model using dynamic resistance thermometry to determine the temperature rise of a current-in-plane GMR sensor in response to imperfect electrical bias (i.e., a DC bias with transients). Measurement and simulation results are given for two different GMR heads (width 500 and 150 nm, respectively). The smaller of the heads is shown to have a virtual instantaneous thermal response (0.2 ns) to transients. Such transients in the bias can, therefore, endanger the read stability and expected lifetime for today's small heads. It is also shown that the peak in the sensor temperature rise is much larger than the sum of the temperature rise due to the bias current and due to the transient current determined separately
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
