Abstract
In this paper, we investigate the microstructural stability of a Cu–Cu joint sintered with microscale Cu particles and Sn-coated Cu (Cu@Sn) particles during an isothermal aging. Using Cu particles and Cu@Sn particles as die attach materials, pure Cu discs were bonded at 200 °C for 20 min with an applied pressure of 10 MPa in a formic acid atmosphere. After the bonding, the Cu sintered joint showed a loosely sintered structure, while the Cu@Sn sintered joint exhibited a microstructure comprised of a Cu3Sn network with a dispersion of Cu particles. The isothermal aging test was conducted at 250 °C in an air atmosphere. Debonding of the Cu sintered joint happened after the aging for only 100 h, due to a severe oxidation of the sintered Cu layer and Cu substrate. On the other hand, the Cu@Sn sintered joints showed better thermal stability. The joint presented nearly 20 MPa shear strength after the aging for 1000 h. The Cu3Sn IMC network suppressed the oxidation of Cu both in the sintered layer and on the substrate, thereby maintaining the microstructural integrity of the Cu@Sn sintered joint.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Materials Science: Materials in Electronics
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
