Abstract
The effects of Pd, Ni, Nb, and Ti interface layers on the thermal stability of Ag films were investigated, and those metals that are appropriate for the interface layers were summarized. The results indicated that Ti and Nb interface layers resulted in thermally stable Ag films by improving the adhesion strength of the Ag films to SiO2 substrates and by enhancing the crystal orientation of Ag(111). It was determined that appropriate interface layer metals for Ag film should have a large Gibbs free energy of formation for the oxide and an appropriate atomic diameter ratio of dmetal/dAg.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
