Abstract

An explicit expression for thermal emissivity of thin films has been derived in terms of optical constants of the substrate and film. At millimicron film thicknesses, the substrate plays a vital rôle in governing the emissivities of the films. For low values of the coefficient of absorption, the emissivity has a value of ε 1( λ) for zero film thickness, reaches a minimum at an optimum value of thickness and then increases monotonically to ε 2( λ) for very large values of thickness. ε 1( λ) and ε 2( λ) are, respectively, the emissivities of the bulk substrate and the film material. For large values of the coefficient of absorption, the emissivity passes through a minimum and then a maximum before monotonically decreasing to ε 2( λ) (for large values of the thickness), as the thickness is increased.

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