Abstract
The oxidation mechanism of Crofer 22 APU, one of the most preferred interconnects for solid oxide fuel cells (SOFCs), was explored in air. Crofer 22 APU showed two-step thermal behavior during thermal exposure, based on the varying growth rate of the chromia scale. The growth rate of the chromia scale abruptly increased at a certain annealed time, suggesting that its formation kinetics changed during thermal exposure. A thickness prediction model for the entire scale of Crofer 22 APU, based on the observed two-step oxidation mechanism, was established using the parabolic rate law.
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