Abstract

The near-surface region of plasma facing material (PFM) plays an important role in thermal management of fusion reactors. In this work, we measured thermal conductivity of tungsten (W) surface layers damaged by He plasma in PISCES at UCSD. We studied the damage effect on both bulk, and thin film, W. We observed that the surface morphology of both bulk and thin film was altered after exposure to He plasma with the fluence of 1 × 1026 m−2 (bulk) and 2 × 1024 m−2 (thin film). Transmission electron microscopy (TEM) analysis reveals that the depth of the irradiation damaged layer was approximately 20 nm on the bulk W exposed to He plasma at 773 K for 2000 s. In order to measure the thermal conductivity of this exceedingly thin damaged layer in the bulk W, we adopted the well-established ‘3-omega’ method and employed novel nanofabrication techniques to improve the measurement sensitivity. For the damaged W thin film sample, we measured the reduction in electrical conductivity and used the Wiedemann-Franz (W-F) law to extract the thermal conductivity. Results from both measurements show that thermal conductivity in the damaged layers was reduced by at least ∼80% compared to that of undamaged W. This large reduction in thermal conductivity can be attributed to the scattering of electrons, the dominant heat carriers in W, caused by defects introduced by He plasma irradiation.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call