Abstract
ZnO thin films were deposited using atom beam sputtering and their modifications have been shown by two processes: (a) thermal annealing of ZnO thin films in oxygen and (b) athermal annealing by irradiation of these films by swift heavy ions (SHIs) in a high vacuum chamber. The as-deposited films showed the nanocrystalline nature with a preferred orientation along the c-axis of the hexagonal structure as revealed by x-ray diffraction (XRD) and Raman spectra. The influence of the thermal annealing and athermal annealing on the structural and surface modifications of these thin films were investigated. XRD and Raman spectroscopy confirmed the improvement in the crystallinity of ZnO thin film by both thermal annealing and SHI irradiation. The Zn–O bonding was confirmed by Fourier transform infrared spectroscopy and the interpretation of IR spectra corroborated the XRD and Raman results. Surface morphology was investigated by atomic force microscopy. The AFM study of the films implied no significant change in the roughness of the films in both types of annealing conditions. It was concluded that the modification of nanocrystalline ZnO thin film could be possible by both thermal and athermal annealing. Results indicate that transient annealing by SHI irradiation induces the highly textured c-axis oriented ZnO thin film for device applications, comparable to those of high temperature annealing.
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