Abstract

Abstract Employing the Landau Fermi liquid theory and evaluating the Landau parameters microscopically in the RPA, we have calculated the line shape of the cyclotron resonance in a two-carrier system which can be realized in Si(100) inversion layers by the application of the uniaxial stress in the [001] direction. Calculated results are compared with the observed line-shape measured recently by Abstreiter et al.

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